X-Ray Radiography can be an effective, non-destructive inspection tool that provides internal viewing of an assembly’s design, internal components, workmanship and potential latent quality issues. Digital X-ray technology has added a new dimension to X-ray inspection extending beyond traditional film based cabinet type technology including algorithms for void analysis. The term digital refers to the technology of image acquisition where the data is collected or transferred to electronically stored media. Digital Radiography detector technologies such as Image Intensifiers and solid state panels can vary in size and pixel counts. Digital radiography based systems can offer the ability to view the sample while manipulating magnification, X-Y directions, rotation, tilting and exposure. The real advantage over traditional cabinet X-ray experiments is the magnification and the ease of image optimization. Actively inspecting the device under manipulation is known as Real-Time X-ray inspection. Some Real-time X-ray systems can be equipped to mechanically step through a defined sequence collecting individual exposures termed slices, that are stitched together generating a 3-D view of the device referred to as Computed Tomography or CT-Scans.
ORS has three digital X-ray systems from the leading X-ray manufacturers, each with unique platforms and technology, allowing versatility to provide the best possible inspection of your devices.
ORS has over 30 years of experience providing X-ray radiography services to the microelectronic, semiconductor and PCBA industries. ORS is DLA suitable in Mil-Std-883 TM 2012 and Mil-Std-750 TM 2076 Radiography inspection.
This non-destructive technique offers immediate and thorough analysis of complex structures of varying densities. Inspection of assemblies can be performed with submicron defect recognition. Percent die attachment voiding, solder sphere formation, void percentage, ball diameter, wire sweep, user adjustable image enhancements and distance measurement are possible. Real Time X-Ray can also be a complimentary technique providing critical information for the proper implementation of subsequent analytical techniques.