Micro Fourier Transform Infrared Spectroscopy(FTIR): FTIR testing is useful for identifying functional groups of small spot size organic contaminants found on surfaces as part of a full surface analysis test.
Scanning Electron Microscopy (SEM): During SEM analysis, the X-rays, characteristic of the area of the specimen being probed by the electron beam, allow both a qualitative and quantitative determination of the elements present in the selected region. High energy back-scattered electrons (BSE) can be separated and used for image formation. Since the back-scattering efficiency is a function of atomic weight, this image reveals compositional variations due to average atomic number.
X-Ray Fluorescence Elemental Analysis (XRF): The X-Ray Fluorescence technique uses high energy X-rays to excite the sample material then determines the material composition based on the radiation emitted, the process is similar to SEM/EDX.
Ion Milling is a surface preparation technique that is used to aid in materials analysis. Ion Milling can provide distinguishable delineations in the surface topography of a sample.