Semiconductor Parametric Testing and Characterization

Semiconductor parametric characterization is available at ORS for a wide range of passive devices and discrete components. Semiconductor parametric testing includes electrical testing of active devices in non-production quantities. Parametric testing of integrated circuits includes curve-tracing and value measurements. Our talented engineering staff can also develop device characterization and semiconductor ATE testing of small-scale integrated circuits upon request.

Parametric testing characterization

Get more information about semiconductor testing.