ORS offers a wide range of analytical techniques for material evaluation, process monitoring and failure analysis. Our laboratory staff has in-depth expertise in electronic components and modules, PCBs, metals, gases, organics and inorganics. Our scientific staff will recommend the analytical technique that will best meet your requirements.
Materials/Surface Analysis Techniques:
Micro Fourier Transform Infrared Spectroscopy(FTIR): This technique is useful for identifying functional groups of small spot size organic contaminants found on surfaces.
Scanning Electron Microscopy (SEM): During SEM analysis the X-rays, characteristic of the area of the specimen being probed by the electron beam, allow both a qualitative and quantitative determination of the elements present in the selected region. High energy back-scattered electrons (BSE) can be separated and used for image formation. Since the back-scattering efficiency is a function of atomic weight, this image reveals compositional variations due to average atomic number.
X-Ray Flourescence Elemental Analysis(XRF): The X-Ray Flourescence technique uses high energy X-rays to excite the sample material then determines the material composition based on the radiation emitted, the process is similar to SEM/EDX.
Ion Milling is a surface preparation technique that is used to aid in Materials Analysis. Ion Milling can provide distinguishable delineations in the surface topography of a sample.