X-Ray Fluorescence Elemental Analysis |
X-Ray Fluorescence is an analytical technique used to perform elemental
identification of materials. This technique is similar to
Scanning Electron Microscopy/Energy Dispersive X-Ray
Analysis (SEM/EDX), which is also used to perform elemental analysis. XRF is preferred for ease
of use and for non-conductive material applications such as plastics, ceramics, glasses, and liquids.
Information Obtained and Applications
° Qualitative Bulk Analysis - Solders, metals, jewlery, plastics, ceramics,
powders and liquids
° Film or plating Analysis – Composition and thickness of PCB/PWB metallization
schemes Au/Ni/Cu
° Quantification of elemental composition including phosphorous content in Nickel
° Identify anomalies/defects and possible causes
° RoHS and prohibitive materials mitigation
Instrument Sensitivity/Capabilities
° SEA 5120 Ultra Thin Window Si(Li) Detector
° Qualitative/Quantitative analysis of microscopic objects (100µm level)
° Detection and identification of elements C -> U
° A video display and frame capture capabilities of sample
° Three collimators: 4-mil, 80-mil, and 80-mil with a Mo filter
° Tube voltage from 15, 45 or 50kV
° Elemental analysis and thick measurements of multiple layers
° Sample size 80mm(W) x 80mm(D) x 35mm(H). Max weight 3kg
|
