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ORS
offers a wide range of analytical techniques for material
evaluation, process monitoring and failure analysis.
Our laboratory staff has in-depth expertise in electronic
components and modules, PCBs, metals, gases, organics
and inorganics. Our scientific staff will recommend
the analytical technique that will best meet your requirements.
Surface
Analysis Techniques:
Micro Fourier
Transform Infrared Spectroscopy:
(FTIR) This technique is useful for identifying functional
groups of small spot size organic contaminants found
on surfaces.
Scanning
Auger Microanalysis:
Provides elemental information from the top atomic layers
of conductor and semiconductor surfaces. In combination
with Argon milling, an elemental profile of the surface
can be plotted, determining variations in elemental
compositions with depth.
Material
Characterizations and Identification Techniques
° Scanning Electron Microscopy (SEM)
° Backscattered Electron Imaging (BSEI)
° Energy Dispersive X-ray Microanalysis
° Fourier Transform Infrared Spectroscopy (FTIR)
° X-ray Diffraction
° Ion Chromatography
° Organic Mass Spectrometry (GC/MS)
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