AND COMPONENT SERVICES OVERVIEW
offers a variety of analytical services to assist you
in the Quality Control, Process Monitoring, Failure
Investigation or Research & Development of your
products. Our goal is to provide you with analytical
tools to aid in maintaining and improving the quality
of your products.
Testing Services for the Microelectronic
A comprehensive suite of tests evaluating the quality
and integrity of microelectronic components and manufacturing
Vapor Analysis (IVA™)
Internal Vapor Analysis (IVA)
is a versatile and precise test procedure developed
at ORS for the Residual Gas Analysis (RGA) of hermetic
packages. The IVA method utilizes advanced Mass
Spectrometry techniques to accurately determine the
relative concentrations of gas or vapor content in hermetic
devices, modules, packages, and inclusions.
Internal Vapor Analysis (IVA)
may now be performed by Gas Chromatography with Mass Spectrometry (GC/MS) to identify unknown
volatile and semi-volatile organics in hermetic devices, modules, and packages. ORS has developed
a procedure to determine relative concentrations of gases in these packages using a modified GC
sample inlet designed at ORS. The GC/MS procedure allows positive identification of unknown
organics not traditionally identified during RGA analysis. This procedure is an excellent
complement to RGA for a “complete picture” of internal vapors.
ORS offers two types of non destructive hermeticity testing. Test methods are designed to determine the quality of a
hermetic seal. Fine leak rates are quantified using
a helium mass spectrometer or a Kr85 Scintillation Detector. Gross leak rates are characterized
by perflourocarbons, dye pentrants or devices failing the initial Kr85 gross leak pressurization. Specialized
testing capabilities to measure the leak rate of various
other gases or compounds (i.e. Argon, Acetic Acid, etc.)
are also available.
The Material Outgassing Characterization test, developed
at ORS, is a qualitative and quantitative analysis of
the off-gassed gaseous substances desorbed from bulk
materials. Outgassing studies may be useful in determining
hydrogen desorption rates, adhesive outgassing species
(pre and post cure), and to characterize other organic
bulk materials used in high reliability components, including polymers, coatings, and epoxies.
This method can even be modified to identify organic contamination on materials.
Organic Mass Spectrometry
Numerous techniques are available to identify volatile and semi-volatile organic compounds, and
impurities from a variety of sample matrices. Sensitivity in the ppb range is commonly obtained. A
useful technique to identify low level "unknown" organic compounds in IVA™ data.
Typically performed on microelectronic devices to determine
or evaluate the inherent design and robustness of a
component by examining its physical characteristics
and quality of workmanship.
Disassembly, testing and inspection of microelectronic
devices to determine conformance with applicable design,
process and procurement requirements.
A comprehensive examination of failed devices or components
to verify a reported failure mode, identify the failure
mechanism, and recommend corrective actions.
Characterization and identification of the surface,
interfaces, and bulk composition of materials.
A variety of analytical techniques are available to
generate data supporting the structure, purity and physical
characteristics of chemical samples submitted for analysis.
Voids, delaminations, cracks and other anomalies in
PEM's, ceramic capacitors, flip chips, BGA's, and other
products may be detected by this non-destructive technique.
Multiple measurement modes including B-Scan, C-Scan
and Through-Scan Transmission provide flexible means
for thorough evaluation.
Time X-Ray Inspection
This non-destructive technique offers immediate and
thorough analysis of complex structures of varying densities.
Inspection of assemblies can be performed while moving,
rotating, and tilting the sample with sub-micron defect
recognition. Traditional high resolution film x-ray
is also available.